Defect detection automated in diamond, other advanced semiconductors
摘要Materials scientists at Rice University have developed a new workflow methodology for measuring microscopic defects in diamond and other advanced semiconductor materials. By making it easier to spot flaws that can undermine performance, the approach could accelerate the development of more reliable electronic and quantum devices.
Materials scientists at Rice University have developed a new workflow methodology for measuring microscopic defects in diamond and other advanced semiconductor materials. By making it easier to spot flaws that can undermine performance, the approach could accelerate the development of more reliable electronic and quantum devices.
分享此文：
微博